#include "dap_enc_iaes_test.h"
#include "dap_enc_oaes_test.h"
#include "dap_enc_base64_test.h"
#include "dap_enc_base58_test.h"
#include "dap_enc_test.h"
#include "dap_enc_msrln_test.h"
#include "dap_enc_defeo_test.h"
#include "dap_enc_sig_bliss_test.h"
#include "dap_enc_picnic_test.h"
#include "dap_enc_tesla_test.h"
#include "dap_enc_dilithium_test.h"
#include "dap_enc_ringct20_test.h"
#include "dap_enc_sign_multi_test.h"
#include "rand/dap_rand.h"

#include "dap_common.h"
#include"ringct20/ring_test.h"
int main(void)
{
    //test
    //test3
    // switch off debug info from library
    dap_log_level_set(L_CRITICAL);
    //LRCT_Setup_Test();
    dap_enc_ringct20_tests_run(100);
    //dap_enc_picnic_tests_run();
    //dap_enc_sig_bliss_tests_run(10);
    //dap_enc_dilithium_tests_run(10);
/*    dap_enc_aes_tests_run();
    dap_enc_oaes_tests_run();
    dap_enc_base64_tests_run();
    dap_enc_base58_tests_run();
    dap_enc_msrln_tests_run();
    dap_enc_tests_run();
    dap_enc_defeo_tests_run();
    dap_enc_tesla_tests_run();
    dap_enc_multi_sign_tests_run();
*/
}